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The equipment is
semiconductor aging testing equipment to
full-automatically execute burn-in processing
and data measurement/judgment/analytical
processing and also has tester function as well
as temperature accelerating testing.
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Features
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Ultra-precise measuring techniques to detect
variation of 10-12 ampere
- A total
system from temperature control to data
processing
- Completed
automatic system by using up-dated computer
techniques
- A full line
up covering from laboratory uses to on-line
production
Functions
- Testing part
Exclusive test
fixtures corresponding to various devices
are prepared, and various testing baths are
prepared corresponding to lot sizes and
point number.
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- Temperature
monitoring of testing bath
Temperature
pattern control and stability monitoring
interlocking to testing modes are executed.
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- Measuring
control processing
Bias applied and
voltage/current/light output to device are
accurately executed and measured values are
transferred to a personal computer.
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- Data
processing
Interactive
settings for aging testing are executed
through a personal computer and sensitivity
is automatically adjusted by a personal
computer. In addition, measured values are
stored into a disk and analytical data can
be shown on a CRT as figure or table format
and outputted.
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- Host
computer communications
Enormous
quantity of data got from again processing
are transferred to a host computer, and
storage. Management and high grade of
analytical processing can be executed.
Applications
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Opto-electronics
devise |
Laser diode
(short wave, long wave)
Photo diode
Opto-semiconductor module
Light emitting diode
LED dot display
EL display device |
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Electronic
parts |
Zener diode
Tantalum capacitor
Mylar capacitor
IC card
VLSI
Transistor
MOS/FET
High frequency transistor
Thermistor
Peltier element
Switching element
Superconductivity element
Hole element |
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Instrument |
Instrument
for the universe
Power module |
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